CCF@U991：CCF容错计算专委走进合肥工业大学暨可信集成电路中日双边国际研讨会

CCF走进高校第991场

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由中国计算机学会（CCF）主办，CCF容错计算专委、合肥工业大学承办的CCF走进高校活动，将于2023年10月18日在合肥工业大学召开，敬请关注。

时间：2023年10月18日（星期三）9:00-17:00

活动地点：合肥工业大学微电子学院A1712会议室

报告信息：

报告题目：Confidential Computing with Hardware Enclaves

报告嘉宾：张吉良/崔津华

嘉宾简介：

张吉良，湖南大学教授，半导体学院（集成电路学院）副院长，国家优秀青年基金获得者，湖南省杰出青年基金获得者、湖南省科技创新领军人才。中国计算机学会容错专委主任。获CCF集成电路Early Career Award、CCF杰出演讲者、湖南省自然科学二等奖（第一），主持国家自然科学基金重点项目、国防科技基础加强计划重点项目等。主要从事信息安全芯片设计、集成电路硬件安全、新型计算架构电路设计等方向研究，以一作或通信发表CCF-A类会议和IEEE/ACM会刊36篇，他连续四年（2020-2023）入选斯坦福大学发布的“全球前2%顶尖科学家”榜单（计算机硬件与体系结构子学科影响力全球排名16）。

报告题目：LSI Testing: A Core Technology to a Successful Semiconductor Industry

报告嘉宾：Xiaoqing Wen (Professor，IEEE Fellow) Kyushu Institute of Technology

嘉宾简介：

Xiaoqing WEN received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, frrom 1993 to 1997, and a Visiting Researcher with the University of Wisconsin–Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Professor of the Department of Computer Science and Networks. He founded Dependable Integarted Systems Research Center at Kyushu Institute of Technology in 2013 and served as its Director until 2015. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is an Associate Editor for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited two popular books, VLSI Test Principles and Architectures: Design for Testability (2006) and Power-Aware Testing and Test Strategies for Low Power Devices (2009). His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Infromation Systmes Society (ISS) of the Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE for his pionerring work in low capture power test generation, a Senior Member of Information Processing Society of Japan (IPSJ), and a Senior Member of IEICE.

报告题目：On the implementation of boundary scan design with embedded time-to-digital converter in a 3D stacked IC

报告嘉宾：Hiroyuki Yotsuyanagi (Professor), Tokushima University

嘉宾简介：

Hiroyuki Yotsuyanagi received the B.E., M.E. and Ph.D degrees from Osaka University, in 1993, 1995 and 1998, respectively. He is currently an Associate Professor of Division of Science and Technology, Graduate School of Technology, Industrial and Social Sciences, Tokushima University. His research interests include design-for-testability methods for delay testing and post-bond testing of 3D ICs. He is a member of IEICE and JIEP, and a senior member of IEEE.

报告题目：SASL-JTAG: A Light-Weight Dependable Test Access Mechanism for Edge Devices

报告嘉宾：Senling Wang (Senior Assistant Professor), Ehime University

嘉宾简介：

Senling Wang received his M.S and Ph.D. degree from the Department of Computer Science and Electronics at the Kyushu Institute of Technology, Japan, in 2011 and 2014, respectively. Since 2014, he has been with the Graduate School of Science and Engineering at Ehime University, Japan, where he currently serves as the Senior Assistant Professor. His research interests include Field Testing, Low Power Testing, Design for Testability, 3D Stacked IC Testing, and Hardware Security. He is the PI for the Grant-in-Aid for Young Scientists and the Grant-in-Aid for Fundamental Scientific Research, both funded by JSPS. He also serves as the Japanese project leader for a Bilateral Joint Research Project between China and Japan, funded by JSPS and NSFC. Dr. Wang has been a program and committee member for numerous international conferences. He is a member of IEEE, ACM, IEICE, IPSJ, and JIEP.

报告题目：An Evaluation of Computing Time of Simple and Secure Authentication

报告嘉宾：Hiroshi Kai (Associate Professor), Ehime University

嘉宾简介：

Hiroshi Kai received the B.E., M.E., and Doctor of Engineering degrees from Ehime University, in 1992, 1994 and 1999, respectively.He is currently an Associate Professor of Department of ComputerScience, Graduate School of Science and Engineering, Ehime University. His Research Interests include algorithms for computer algebra system, hybrid symbolic-numeric computation, information security. He is a member of ACM, IEEE, and Japanese societies IPSJ and JSSAC.

报告题目：Tackling Test and Diagnosis Challenges Using GPU-Based High-Throughput Timing Simulation

报告嘉宾：Stefan Holst (Associate Professor), Kyushu Institute of Technology

嘉宾简介：

Stefan Holst received his PhD in 2012 from University of Stuttgart, Germany, under supervision of Prof. Hans-Joachim Wunderlich. In 2013, he joined Kyushu Institute of Technology (Japan) where he is now an associate professor in the Department of Computer Science and Networks. He published over 50 works in journals, at international conferences and at peer-reviewed workshops and received three best paper awards (ETS2007, ATS2015, ATS2021). His research interests include reliability of AI hardware, VLSI simulation and diagnosis, soft-error tolerance as well as power-aware test.

报告题目：  A Novel High Performance Scan-Test-Aware Hardened Latch Design with Improved Soft-Error Tolerability

报告嘉宾：Dr. Ruijun Ma (Anhui University of Science & Technology)

嘉宾简介：

Ruijun Ma received a Ph.D. degree in the Kyushu Institute of Technology, Japan, in 2022. He currently works at the Anhui University of Science and Technology. His research interests include soft-error tolerance, hardened latch design, and design-for-test.

报告题目：Cutting Costs in IC Testing with Machine Learning

报告嘉宾：Dr. Tai Song (Anhui University)

嘉宾简介：

Tai Song received the Dr.-Ing. degree in Microelectronics from Hefei University of Technology, China since 2020. As a joint doctoral student, he visited the University of Stuttgart, Baden-Württemberg, Germany, from 2019 to 2020. Since 2021, he has been a full-time teacher working in the School of Integrated Circuits of Anhui university, China. For the last few years, his work has been mainly focused on VLSI test, IC reliability, machine learning, Hardware Trojan detection, Chiplet design and test. Some of the leading scientific journals he has published include IEEE VTS, JETTA, Integration the VLSI and the honour of best paper for CFTC2023. These publications can be found at: [https://orcid.org/0000-0002-7082-4211]. (Based on document published on 12 October 2023).

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